Courses

Power and Thermal Validation on Silicon

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Validate power and thermal performance of silicon chips. Covers TDP measurement, IDD current profiling, thermal resistance measurement, die temperature mapping, thermal throttling validation, DVFS characterisation, and power-state sequence verification using real power analysis boards and thermal ca

Failure Analysis and Root Cause Debug

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Learn systematic Failure Analysis (FA) and root cause debugging for silicon defects. Covers FA workflow, SEM, FIB cross-section, OBIC, photoemission microscopy, and backside debug. Bridges validation findings with wafer-level defect analysis for yield and reliability improvement.

Silicon Characterisation and Coverage

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Characterise silicon performance across PVT (Process, Voltage, Temperature) corners. Covers V/F shmoo plots, speed binning, leakage and active power measurement, PVT sensitivity analysis, and statistical data analysis for characterisation report generation.

Oscilloscope and Logic Analyser for Chips

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Master oscilloscope and logic analyser use for chip bring-up and debug. Covers probing techniques, bandwidth and sample rate selection, triggering, waveform analysis, logic analyser state/timing modes, protocol decoding (I2C, SPI, UART), and mixed-signal debug using Keysight and Tektronix equipment.

High-Speed IO Debug PCIe DDR USB

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Debug high-speed IOs (PCIe, DDR, USB) on real silicon. Covers eye diagram measurements, BER testing with BERT, protocol analyser usage, DDR training algorithm debug, PCIe link training failure analysis, and USB enumeration debug using real silicon boards and instruments.

Lab Bring-Up and Debug Methodology

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Learn systematic silicon bring-up and debug methodology for first-silicon success. Covers power-up sequence validation, clock and reset bring-up, JTAG access, basic register reads, memory test, and boot flow debugging. Includes real case studies of silicon bring-up challenges and fault isolation tec