Learn ATE operation and test program development for semiconductor production test. Covers ATE system architecture (Advantest/Teradyne), device interface boards (DIB/load board), test program creation, parametric and functional test, yield improvement through ATE data analysis, and ATE-DFT co-design
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| Expiry period | Lifetime | ||
| Made in | English | ||
| Last updated at | Sun Apr 2026 | ||
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| Total lectures | 0 | ||
| Total quizzes | 0 | ||
| Total duration | Hours | ||
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| Number of reviews | 568 | ||
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| Short description | Learn ATE operation and test program development for semiconductor production test. Covers ATE system architecture (Advantest/Teradyne), device interface boards (DIB/load board), test program creation, parametric and functional test, yield improvement through ATE data analysis, and ATE-DFT co-design | ||
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