Generate high-quality test patterns using ATPG for maximum fault coverage. Covers stuck-at, transition, and path delay fault models, fault simulation, ATPG pattern optimisation, diagnostic patterns, and tester-ready pattern export. Uses Synopsys TetraMAX and Mentor Tessent on real SoC designs.
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| Expiry period | Lifetime | ||
| Made in | English | ||
| Last updated at | Sun Apr 2026 | ||
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| Total lectures | 0 | ||
| Total quizzes | 0 | ||
| Total duration | Hours | ||
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| Number of reviews | 759 | ||
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| Short description | Generate high-quality test patterns using ATPG for maximum fault coverage. Covers stuck-at, transition, and path delay fault models, fault simulation, ATPG pattern optimisation, diagnostic patterns, and tester-ready pattern export. Uses Synopsys TetraMAX and Mentor Tessent on real SoC designs. | ||
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