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Design for Testability (DFT)

Design for Testability (DFT)

₹12500

₹25000

Learn the fundamentals of DFT for ASIC and SoC designs. Covers stuck-at and transition fault models, scan chain insertion, test compression (EDT), boundary scan (JTAG/IEEE 1149.1), ATPG fundamentals, and DFT sign-off methodology. Uses Synopsys DFT Compiler and Mentor Tessent flows.

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Has discount
Expiry period Lifetime
Made in English
Last updated at Sun Apr 2026
Level
Intermediate
Total lectures 0
Total quizzes 0
Total duration Hours
Total enrolment 0
Number of reviews 395
Avg rating
Short description Learn the fundamentals of DFT for ASIC and SoC designs. Covers stuck-at and transition fault models, scan chain insertion, test compression (EDT), boundary scan (JTAG/IEEE 1149.1), ATPG fundamentals, and DFT sign-off methodology. Uses Synopsys DFT Compiler and Mentor Tessent flows.
Outcomes
  • Understand core concepts of Design for Testability DFT VLSI ASIC Scan JTAG
  • Apply practical workflows in DFT
  • Build job-ready skills for VLSI Design Courses
  • Work with DFT
  • Work with design for testability
  • Work with scan insertion
  • Work with ATPG
  • Work with test coverage
Requirements
  • Basic understanding of electronics and circuits
  • A laptop/desktop with stable internet
  • Suitable for professionals
  • Recommended for dft engineer
  • Tools access can be enabled with this course