Learn systematic Failure Analysis (FA) and root cause debugging for silicon defects. Covers FA workflow, SEM, FIB cross-section, OBIC, photoemission microscopy, and backside debug. Bridges validation findings with wafer-level defect analysis for yield and reliability improvement.
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| Expiry period | Lifetime | ||
| Made in | English | ||
| Last updated at | Sun Apr 2026 | ||
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| Total lectures | 0 | ||
| Total quizzes | 0 | ||
| Total duration | Hours | ||
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| Number of reviews | 933 | ||
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| Short description | Learn systematic Failure Analysis (FA) and root cause debugging for silicon defects. Covers FA workflow, SEM, FIB cross-section, OBIC, photoemission microscopy, and backside debug. Bridges validation findings with wafer-level defect analysis for yield and reliability improvement. | ||
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