Debug high-speed IOs (PCIe, DDR, USB) on real silicon. Covers eye diagram measurements, BER testing with BERT, protocol analyser usage, DDR training algorithm debug, PCIe link training failure analysis, and USB enumeration debug using real silicon boards and instruments.
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| Expiry period | Lifetime | ||
| Made in | English | ||
| Last updated at | Sun Apr 2026 | ||
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| Total lectures | 0 | ||
| Total quizzes | 0 | ||
| Total duration | Hours | ||
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| Number of reviews | 1000 | ||
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| Short description | Debug high-speed IOs (PCIe, DDR, USB) on real silicon. Covers eye diagram measurements, BER testing with BERT, protocol analyser usage, DDR training algorithm debug, PCIe link training failure analysis, and USB enumeration debug using real silicon boards and instruments. | ||
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